DLP-type 2D + 3D sensor *Conducts various 3D inspections at high speed!
Coexistence of 3D inspection capabilities with conventional 2D inspection! Supports shape inspection of semiconductors with a size of 15mm square.
The "DLP-type 2D + 3D sensor" is a product that performs high-speed 3D inspection of various products. The Z accuracy is 2μm, and it can accommodate XY sizes up to 1m x 1m, with a cycle time of up to 0.05 seconds. We also offer options that can be added to existing 2D inspections. Please feel free to contact us when you need assistance. [Support] ■ Development support for both hardware and software ■ Addressing blind spots in three-dimensional workpieces ■ Support for composite materials and brightness unevenness *For more details, please download the PDF or feel free to contact us.
- Company:ヒューブレイン
- Price:Other